The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Feb. 24, 2003
Applicants:

Patrick Dooling Bossman, Alexandria, VA (US);

You-chin Fuh, San Jose, CA (US);

Chan-hua Liu, San Jose, CA (US);

Ping Wang, San Jose, CA (US);

Yun Wang, Saratoga, CA (US);

Jie Zhang, San Jose, CA (US);

Inventors:

Patrick Dooling Bossman, Alexandria, VA (US);

You-Chin Fuh, San Jose, CA (US);

Chan-Hua Liu, San Jose, CA (US);

Ping Wang, San Jose, CA (US);

Yun Wang, Saratoga, CA (US);

Jie Zhang, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a method, system, an program for tuning a database query. Provided are a base access plan to implement the database query and statistics including information on a layout of the database against which the query will be executed. The statistics are processed to determine performance problems with the base access plan as part of a first analysis of the base access plan and the determined performance problems are processed as part of a second analysis to provide an analysis of the determined performance problems and processing cost of the base access plan. Recommendations are generated to tune the base access plan to improve performance.


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