The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Sep. 29, 2004
Applicant:

Khai Minh Le, Huntington Beach, CA (US);

Inventor:

Khai Minh Le, Huntington Beach, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for processing signals output from an array of X-ray radiation detectors which receive X-ray radiation emanating from an object irradiated by a source beam of X-ray radiation, to thereby produce an visual image of internal object features, utilizes repetitive sampling P times and digital accumulation of signals output from each detector to increase signal-to-noise ratio of the images by the factor 1/✓P. In a basic embodiment, each of the N detectors in a linear detector array is sampled P times. In another embodiment, artifacts resulting from decay of detector pre-amplifier output voltages on capacitors of low-pass filter circuits, referred to as pseudo-integrators, are reduced by sequentially sampling and accumulating each of N detector amplifier output voltages P times in turn, and repeating the sampling and accumulating sequence Q times, thereby reducing variations in the P×Q accumulated values between the first and last detector channels of an N detector array.


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