The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Sep. 23, 2004
Nevin A. Archibald, Canyon Country, CA (US);
Tariq Iqbal, Corona, CA (US);
Joseph M. Viglione, Laguna Hills, CA (US);
Nevin A. Archibald, Canyon Country, CA (US);
Tariq Iqbal, Corona, CA (US);
Joseph M. Viglione, Laguna Hills, CA (US);
Western Digital Technologies, Inc., Lake Forest, CA (US);
Abstract
Disclosed are techniques related to cluster-based defect detection testing for disk drives. A disk drive comprises a disk, a moveable head to scan the tracks of the disk, and a defect detection circuit to detect defects on the disk scanned by the moveable head. The disk drive includes a microprocessor for controlling operations in the disk drive including cluster-based defect detection. The microprocessor under the control of a cluster detection program defines a scan window. The scan window corresponds to an area of the disk scanned by the moveable head. The microprocessor under the control of the cluster detection program further defines a cluster threshold corresponding to a minimum number of defects required to occur within the scan window and identifies a defect cluster if a cluster threshold of defects occurs within the scan window. By identifying defect clusters on the disk these defect clusters can be margined.