The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Mar. 11, 2002
Vincent Wu, Irvine, CA (US);
Cuong Tran, Orange, CA (US);
Vincent Wu, Irvine, CA (US);
Cuong Tran, Orange, CA (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Tec Kabushiki Kaisha, Tokyo, JP;
Abstract
The present invention provides a method and system for testing the output of a digital imaging system. The method comprises the steps of sending a test job to a test digital imaging system and generating test information. The test information suitably comprises a plurality of computed values, each computed value corresponding to a portion of the test job. The test information is then compared with control information produced by sending the test job to a control digital imaging system. In addition, the invention provides a digital imaging device designed to accept test job and capable of generating the test information upon initiation of testing procedures.