The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Feb. 25, 2005
James Benson Bacque, Ottawa, CA;
Ping Wai Wan, Kanata, CA;
Derrick Remedios, Nepean, CA;
Eddie Kai Ho NG, Ottawa, CA;
James Benson Bacque, Ottawa, CA;
Ping Wai Wan, Kanata, CA;
Derrick Remedios, Nepean, CA;
Eddie Kai Ho Ng, Ottawa, CA;
Tropic Networks Inc., Kanata, CA;
Abstract
A multi-stage method and apparatus for determining a faulty component location along an optical path through an optical fiber in an optical network are disclosed. A total power of the optical fiber, and a total wavelength power as a sum of powers of the individual wavelengths at a plurality of local detection points are measured and compared at the local detection points, followed by determining whether or not a faulty detection point exists along the optical path. If a fault is identified, the method provides a multi-stage fault detection procedure, including measuring a total wavelength power loss between a local detection point and an adjacent detection point, between the local detection point and multiple non-adjacent detection points, and a correlation of the measured total wavelength power losses between the various detection points. A corresponding apparatus for determining the faulty component location in the optical network is also provided.