The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Jan. 21, 2005
Applicants:

Tetsuya Miwa, Gifu-ken, JP;

Tsutomu Imai, Gifu-ken, JP;

Seiji Kai, Gifu-ken, JP;

Takayuki Kaida, Gifu-ken, JP;

Inventors:

Tetsuya Miwa, Gifu-ken, JP;

Tsutomu Imai, Gifu-ken, JP;

Seiji Kai, Gifu-ken, JP;

Takayuki Kaida, Gifu-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 27/148 (2006.01);
U.S. Cl.
CPC ...
Abstract

A compact semiconductor device having a contact hole that improves stability of electric connection between a wire and an electrode. The semiconductor device includes an insulation layer formed on a semiconductor substrate, first electrodes formed on the insulation layer and spaced from one another by an interval, an insulation film covering the first electrodes, and spaced second electrodes formed on the insulation film. Each second electrode includes an intermediate portion filling the space between two adjacent first electrodes, two edge portions respectively laid above the two adjacent first electrodes in an overlapping manner, and an upper surface connected to a wire by a contact. Thickness, t, of the insulation film, thickness, t, of each edge portion of the second electrode, and interval, S, between the first electrodes are adjusted to satisfy the expression of S<(2t+2t).


Find Patent Forward Citations

Loading…