The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Aug. 28, 2003
Kazuhiko Arai, Hachioji, JP;
Akio Kosaka, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Kazuhiko Arai, Hachioji, JP;
Akio Kosaka, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system is formed by combining a plurality of three-dimensionally arranged planes. The calibration pattern unit comprises supporting members each of which has a predetermined surface corresponding to one of the planes, and a calibration pattern in which a predetermined pattern is formed on the predetermined surface of the supporting member. The supporting member can selectively set the calibration pattern unit to a first form for photographing when the correction information is obtained, and a second form for other purposes.