The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Jun. 29, 2005
Applicants:

Yoshikazu Nakayama, Hirakata, JP;

Akio Harada, Osaka, JP;

Seiji Akita, Izumi, JP;

Inventors:

Yoshikazu Nakayama, Hirakata, JP;

Akio Harada, Osaka, JP;

Seiji Akita, Izumi, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 13/16 (2006.01); G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nanotube probe assembled under real-time observation inside an electron microscope, the probe including a nanotube; a holder for holding the nanotube; and a fastening means for fastening the nanotube at a base end portion thereof to the holder; and the tip end portion of the nanotube protrudes from the holder. The method for manufacturing a nanotube probe includes the steps of setting up a nanotube and a holder inside an electron microscope; allowing a base end portion of the nanotube, with a tip end portion thereof protruding, to come into contact with the holder; and irradiating electron beam to the base end portion of the nanotube to form a carbon film at the base end portion of the nanotube, or forming a fused part at the base end portion of the nanotube, thus fastening the base end portion of the nanotube to the holder by the carbon film.


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