The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Sep. 02, 2004
Applicants:

Tetsuya Suzuki, Kawaguchi, JP;

Hideki Takiguchi, Sagamihara, JP;

Toshiyuki Marui, Sagamihara, JP;

Kazuhiko Fujikura, Hachioji, JP;

Kazuhito Ihara, Hachioji, JP;

Yasuo Taima, Chofu, JP;

Kenji Ohnuma, Hino, JP;

Hiroto Ito, Hachioji, JP;

Inventors:

Tetsuya Suzuki, Kawaguchi, JP;

Hideki Takiguchi, Sagamihara, JP;

Toshiyuki Marui, Sagamihara, JP;

Kazuhiko Fujikura, Hachioji, JP;

Kazuhito Ihara, Hachioji, JP;

Yasuo Taima, Chofu, JP;

Kenji Ohnuma, Hino, JP;

Hiroto Ito, Hachioji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C 1/00 (2006.01); G03C 1/005 (2006.01); G03C 1/494 (2006.01); G03C 5/16 (2006.01); G03C 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A silver salt photothermographic dry imaging material wherein said material has photographic speeds (1) and (2) determined based on the predetermined conditions and the photographic speed (2) is not more than 1/10 of the photographic speed (1), and the coefficient of determination value Rof the linear regression line is 0.998–1.000, which is obtained from the predetermined density points having a* and b* arranged in two-dimensional coordinates in which a* is used as the abscissa and b* is used as the coordinate of the CIE 1076 (L*a*b*) color space, b* of the intersection point of the linear regression line with the ordinate is −5–5, and gradient (a*/b*) is 0.7–2.5.


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