The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Jun. 29, 2001
Matteo Leonardi, Lausanne, CH;
Stefan Metz, Lausanne, CH;
Daniel Bertrand, Geneva, CH;
Peter Leuenberger, Conches, CH;
Matteo Leonardi, Lausanne, CH;
Stefan Metz, Lausanne, CH;
Daniel Bertrand, Geneva, CH;
Peter Leuenberger, Conches, CH;
Abstract
A new noninvasive approach for intraocular pressure (IOP) measurement allowing continuous monitoring over prolonged periods, regardless of patient's position and activities. The key element of this measurement method is a soft contact lens () including at least one strain gage () longitudinally arranged around the center of the contact lens and capable of measuring precisely spherical deformations of the eyeball induced by the changes in IOP. This information is transmitted with wires or (preferably) wirelessly in real time to an external recording system (). The system is placed in the same way as a normal corrective contact lens, no anesthesia is required and patient vision remains almost completely unimpaired.