The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Jun. 25, 2004
Applicants:

David E. Ferguson, Averill Park, NY (US);

Norman A. Lindeman, Sand Lake, NY (US);

Inventors:

David E. Ferguson, Averill Park, NY (US);

Norman A. Lindeman, Sand Lake, NY (US);

Assignee:

Dynamic Systems Inc., Poestenkill, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and an accompanying method for use in a conventional dynamic material testing system to advantageously provide enhanced self-resistive specimen heating. Specifically, a fixture () is added to the system. The fixture has two supporting arms (), each holding one of two opposing and conductive anvil assemblies (). The fixture applies adequate force to each arm sufficient to hold a specimen () in position between the anvil assemblies and establish a good abutting electrical contact between the specimen and each assembly but without exerting enough force to deform the specimen as it is being heated. Separate opposing and existing coaxially-oriented shafts () controllably strike both arms and move the anvils together, hence squeezing the specimen and generating each deformation therein. Electrical heating current is controllably applied through the support arms, the anvils and the specimen in order to self-resistively heat the specimen in a predefined temporal manner with respect to the specimen deformations.


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