The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2006

Filed:

Mar. 31, 2005
Applicant:

Victor B. Kley, Berkeley, CA (US);

Inventor:

Victor B. Kley, Berkeley, CA (US);

Assignee:

General Nanotechnology LLC, Berkeley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G12B 21/22 (2006.01); G01N 13/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, the tip and cantilever members have active components to produce kinetic action, thus facilitating the utility of the probe assembly in various SPM applications.


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