The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Aug. 27, 2004
Bruce J. Whitefield, Camas, WA (US);
David A. Abercrombie, Gresham, OR (US);
David R. Turner, Albuquerque, NM (US);
James N. Mcnames, Portland, OR (US);
Bruce J. Whitefield, Camas, WA (US);
David A. Abercrombie, Gresham, OR (US);
David R. Turner, Albuquerque, NM (US);
James N. McNames, Portland, OR (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method for determining component patterns of a raw substrate map. A subset of substrate patterns is selected from a set of substrate patterns, and combined into a composite substrate map. The substrate patterns are weighted. The composite substrate map is compared to the raw substrate map, and a degree of correlation between the composite substrate map and the raw substrate map is determined. The steps are iteratively repeated until the degree of correlation is at least a desired degree, and the weighted subset of substrate patterns is output as the component patterns of the raw substrate map.