The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Oct. 29, 2004
Stephen Eichblatt, San Jose, CA (US);
Laurence Samuelson, San Jose, CA (US);
Stephen Eichblatt, San Jose, CA (US);
Laurence Samuelson, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention pertain to methods of evaluating processes for manufacturing components. In one embodiment, an average probability of a first component to fail is calculated based on a measurement of a parameter where the first component was built using a new process. Another average probability of a second component to fail is calculated based on a measurement of the parameter where the second component was built using an existing process. A process index is calculated by determining a difference between the average probabilities for the second component and the first component. An estimation is made as to whether the new process is better than the existing process based on the process index.