The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Nov. 03, 2003
Jochen Rivoir, Magstadt, DE;
John Mclaughlin, Santa Rosa, CA (US);
Joseph M. Gorin, Santa Rosa, CA (US);
Moray Denham Rumney, Edinburgh, GB;
Matthew Johnson, Spokane, WA (US);
Robert Locascio, Crystal Lake, IL (US);
Peter J. Cain, Lasswade Midlothian, GB;
David H. Molinari, Newman Lake, WA (US);
George S. Moore, Veradale, WA (US);
Jochen Rivoir, Magstadt, DE;
John McLaughlin, Santa Rosa, CA (US);
Joseph M. Gorin, Santa Rosa, CA (US);
Moray Denham Rumney, Edinburgh, GB;
Matthew Johnson, Spokane, WA (US);
Robert Locascio, Crystal Lake, IL (US);
Peter J. Cain, Lasswade Midlothian, GB;
David H. Molinari, Newman Lake, WA (US);
George S. Moore, Veradale, WA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Using component-level test data to reduce system test. By modeling a system, sensitivity analysis reveals critical components and parameters of those components required to meet system performance parameters. Critical components are tested for these parameters, and these measurements associated with the components. Systems may be assembled which are modeled to meet the system performance parameters based on the model and the measured parameters. Systems may be assembled and calibration coefficients derived and applied from the model and the measured parameters.