The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
May. 25, 2005
Chang-meng B. Hsiung, Irvine, CA (US);
Bethsabeth Munoz, Pasadena, CA (US);
Ajoy Kumar Roy, Pasadena, CA (US);
Michael Gregory Steinthal, Los Angeles, CA (US);
Steven A. Sunshine, Pasadena, CA (US);
Michael Allen Vicic, Pasadena, CA (US);
Shou-hua Zhang, Arcadia, CA (US);
Chang-Meng B. Hsiung, Irvine, CA (US);
Bethsabeth Munoz, Pasadena, CA (US);
Ajoy Kumar Roy, Pasadena, CA (US);
Michael Gregory Steinthal, Los Angeles, CA (US);
Steven A. Sunshine, Pasadena, CA (US);
Michael Allen Vicic, Pasadena, CA (US);
Shou-Hua Zhang, Arcadia, CA (US);
Smiths Detection Inc., Pasadena, CA (US);
Abstract
A method for controlling an industrial process. The method includes outputting a plurality of parameters from a process for manufacture of a substance. The method also uses each of the plurality of parameters in a computer aided process, which compares at least two of the plurality of parameters against a training set of parameters. The training set of parameters is generally predetermined. A step of determining if the at least two of the plurality of parameters are within a predetermined range of the training set of parameters also is included. Additionally, the method includes outputting a result based upon the determining step.