The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Oct. 03, 2002
Lothar Wenzel, Round Rock, TX (US);
Ram Rajagopal, Austin, TX (US);
Satish V. Kumar, Austin, TX (US);
Darren R. Schmidt, Cedar Park, TX (US);
Kevin M. Crotty, Austin, TX (US);
Matthew S. Fisher, Austin, TX (US);
Dinesh Nair, Austin, TX (US);
Lothar Wenzel, Round Rock, TX (US);
Ram Rajagopal, Austin, TX (US);
Satish V. Kumar, Austin, TX (US);
Darren R. Schmidt, Cedar Park, TX (US);
Kevin M. Crotty, Austin, TX (US);
Matthew S. Fisher, Austin, TX (US);
Dinesh Nair, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for determining a mapping operator for use in a pattern matching application, where the mapping operator enhances differences between respective objects of interest and background objects, e.g., objects not of interest. First and second information is received regarding an object of interest and objects that may appear with the object of interest in an acquired target data set, respectively. The mapping operator is determined using the first information and the second information by determining a template discrete curve characterizing the object of interest, determining one or more target discrete curves characterizing the background objects, and generating a mapping operator that enhances differences between the mapped template discrete curve and the mapped target discrete curves. The operator is stored in a memory and is operable to be used in a pattern matching application to locate instances of the object of interest in acquired target data sets or images.