The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2006

Filed:

Aug. 23, 2002
Applicants:

Ho-chi Hwang, Hsin-Chu, TW;

Ching-yao Su, Tainan, TW;

Wei-nan Sun, Kaohsiung, TW;

Inventors:

Ho-Chi Hwang, Hsin-Chu, TW;

Ching-Yao Su, Tainan, TW;

Wei-Nan Sun, Kaohsiung, TW;

Assignee:

Mediatek, Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/10 (2006.01); H04L 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A receiver includes a Viterbi-like equalizer that provides diversity combining of soft values to produce reliability information. The output reliability information at time k is the average of the first reliability information at time k and the second reliability information at time (k−1) after being normalized by the noise power. The first reliability information at time k is the difference between the two accumulated metrics of the two preceding nodes arriving at the same node having the global minimum node metric at time k over all transitions of all states. The second reliability function at time k is the difference between the best accumulated metric characterized by the last (L−1) bit being binary 'one' and the best accumulated metric characterized by the last (L−1) bit being binary 'zero.'


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