The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2006

Filed:

Apr. 23, 2003
Applicants:

Gunther Notni, Jena, DE;

Mathias Heinze, Jena, DE;

Peter Kuehmstedt, Jena, DE;

Inventors:

Gunther Notni, Jena, DE;

Mathias Heinze, Jena, DE;

Peter Kuehmstedt, Jena, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for determining the spatial co-ordinates of an object, whereby the object is illuminated with patterns of light from at least two directions by means of a projection device. A calibrating camera and at least one measuring camera at least partially record the patterns of light projected onto the object, the calibrating camera being fixed in relation to the object. The projection device is calibrated by means of at least four phase measuring values, the measuring camera is calibrated using at least two phase measuring values, the three-dimensional co-ordinates of the object are calculated using at least one phase measuring value. The projection device and the measuring camera are thus transferred together into the desired positions.


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