The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2006

Filed:

Jun. 10, 2004
Applicants:

William A. Ellingson, Naperville, IL (US);

Robert J. Visher, Downers Grove, IL (US);

Inventors:

William A. Ellingson, Naperville, IL (US);

Robert J. Visher, Downers Grove, IL (US);

Assignee:

UChicago Argonne LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus for observing and measuring in realtime surface and subsurface characteristics of objects having complex shapes includes an optical fiber bundle having first and second opposed ends. The first end includes a linear array of fibers, where the ends of adjacent fibers are in contact and are aligned perpendicular to the surface of the object being studied. The second ends of some of the fibers are in the form of a polished ferrule forming a multi-fiber optical waveguide for receiving laser light. The second ends of the remaining fibers are formed into a linear array suitable for direct connection to a detector, such as a linear CMOS-based optical detector. The output data is analyzed using digital signal processing for the detection of anomalies such as cracks, voids, inclusions and other defects.


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