The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2006

Filed:

May. 25, 2001
Applicants:

Larry I. Gritz, Berkeley, CA (US);

Craig Eugene Kolb, Berkeley, CA (US);

Matthew Milton Pharr, San Francisco, CA (US);

Eric Veach, Redwood City, CA (US);

Inventors:

Larry I. Gritz, Berkeley, CA (US);

Craig Eugene Kolb, Berkeley, CA (US);

Matthew Milton Pharr, San Francisco, CA (US);

Eric Veach, Redwood City, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates generally to the art of computer graphics, and more specifically to the field of line sampling object scene information for the purpose of reconstructing an image of the object scene. In particular, the inventions distributes a set of line samples across an image plane such that the distribution of the set of line samples is non-regular. Additionally, the invention projects objects from an object scene onto an image plane and computes a view of the objects along each line sample in the set of line samples. Finally, the invention combines the view along each line sample in the set of line samples to form a view of the object scene.


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