The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Jan. 06, 2004
Jian Wang, Beijing, CN;
Liyong Chen, Beijing, CN;
Yingnong Dang, Beijing, CN;
Xiaoxu MA, Cambridge, MA (US);
Jian Wang, Beijing, CN;
Liyong Chen, Beijing, CN;
Yingnong Dang, Beijing, CN;
Xiaoxu Ma, Cambridge, MA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
X-y positions of a digital pen's tip may be determined by using a calibration parameter to map the x-y positions of the respective centers of images captured by the pen's camera. The calibration parameter may be generated by iteratively calculating estimates of the calibration parameter. Calibration input data may be produced by a user placing the pen tip in a fixed location on a surface, which may be a positionally encoded medium, such as paper, and then rotating the pen and/or moving the opposite end of the pen in various directions to capture multiple images for use in generating the calibration parameter. A user may perform such a calibration procedure without the need for complicated calibration equipment typically used in connection with conventional calibration techniques.