The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Feb. 01, 2005
Mark D. Kittel, Berea, OH (US);
Joseph Miglionico, Euclid, OH (US);
Richard L. Sandt, Brunswick, OH (US);
Terrence Sullivan, Medina, OH (US);
Mark D. Kittel, Berea, OH (US);
Joseph Miglionico, Euclid, OH (US);
Richard L. Sandt, Brunswick, OH (US);
Terrence Sullivan, Medina, OH (US);
Avery Dennison Corporation, Pasadena, CA (US);
Abstract
A tamper monitoring article and system, and an associated method of making, installing and using the article and system. The article has an elongate body portion. The body portion has a first end portion that adheres to a second end portion, if present, or to a substrate. The article also includes a pathway structure that runs along or throughout the body portion and can conduct energy, such as light or electricity, along its length. A monitor communicates with the pathway structure and detects a change in the energy being conducted thereby. A change in the energy is indicative of a change in a conductive property of the pathway structure caused by, for example, manipulation of the body portion and the pathway structure that is disposed therein or thereon. The monitor can then signal, or respond to a request signal, and provide information that such manipulation has occurred.