The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Apr. 21, 2005
Jonathan W. Campbell, Harvest, AL (US);
Jonathan W. Campbell, Harvest, AL (US);
Abstract
The sky contains many active sources that emit X-rays, gamma rays, and neutrons. Unfortunately hard X-rays, gamma rays, and neutrons cannot be imaged by conventional optics. This obstacle led to the development of Fourier imaging systems. In early approaches, multiple grid pairs were necessary in order to create rudimentary Fourier imaging systems. At least one set of grid pairs was required to provide multiple real components of a Fourier derived image, and another set was required to provide multiple imaginary components of the image. It has long been recognized that the expense associated with the physical production of the numerous grid pairs required for Fourier imaging was a drawback. Herein one grid pair (two grids), with accompanying rotation and translation, can be used if one grid has one more slit than the other grid, and if the detector is modified.