The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2006
Filed:
Dec. 16, 2004
Applicants:
Charles H. Joyner, Sunnyvale, CA (US);
Mark J. Missey, San Jose, CA (US);
Radhakrishnan L. Nagarajan, Cupertino, CA (US);
Frank H. Peters, San Jose, CA (US);
Mehrdad Ziari, Pleasanton, CA (US);
Fred A. Kish, Jr., Palo Alto, CA (US);
Inventors:
Charles H. Joyner, Sunnyvale, CA (US);
Mark J. Missey, San Jose, CA (US);
Radhakrishnan L. Nagarajan, Cupertino, CA (US);
Frank H. Peters, San Jose, CA (US);
Mehrdad Ziari, Pleasanton, CA (US);
Fred A. Kish, Jr., Palo Alto, CA (US);
Assignee:
Infinera Corporation, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed is a method of in-wafer testing of integrated optical components and in-wafer chips with photonic integrated circuits (PICs).