The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7134787 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 14, 2006

Filed:

Jun. 15, 2004
Applicants:

Haining Sun, Shenyang, CN;

Shanshan Lou, Shenyang, CN;

Jinjun Liu, Shenyang, CN;

Inventors:

Haining Sun, Shenyang, CN;

Shanshan Lou, Shenyang, CN;

Jinjun Liu, Shenyang, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of CT beam hardening calibration comprises: the step of obtaining raw data of a first phantom and a second phantom by scanning the first phantom and the second phantom respectively; the step of calculating a first filter material length and a second filter material length according to one ore more spectrum function and the raw data of the first phantom as well as the second phantom; the step of adjusting said spectrum function to make the first filter material length and the second filter material length agree with predefined conditions; the step of calculating a beam hardening curve according to the adjusted spectrum function and the first filter material length as well as the second filter material length met with the predefined conditions; and the step of processing the raw data by the calculated beam hardening curve to eliminate beam hardening effects. After calibrating raw data by using the adjusted spectrum curve, image results showed that artifacts such as shading dark artifacts and rings artifacts were significantly reduced.


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