The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7134063 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 07, 2006

Filed:

Jun. 12, 2003
Applicants:

Sang-yeun Cho, Seoul, KR;

Yong-chun Kim, Yongin, KR;

Inventors:

Sang-yeun Cho, Seoul, KR;

Yong-chun Kim, Yongin, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for testing an on-chip ROM and a method thereof are provided. By embedding the on-chip ROM test apparatus in a semiconductor chip and externally providing only minimal information, the apparatus and the method can prevent the possible exposure of ROM data stored in the ROM. Also, according to the apparatus and method, information related to the ROM address at which an error occurred can be provided together with the test result and by feeding the ROM address information back to the manufacturing process, product yield can be improved.


Find Patent Forward Citations

Cho, Sang-yeun. (2006). Apparatus and method for testing on-chip rom (U.S. Patent No. 7134063). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7134063

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