The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7134060 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 07, 2006

Filed:

Jan. 08, 2004
Applicants:

Yoshiyuki Tanaka, Kanagawa, JP;

Yoshinari Ojima, Tokyo, JP;

Inventors:

Yoshiyuki Tanaka, Kanagawa, JP;

Yoshinari Ojima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit disclosed herein comprising: a phase control circuit which shifts a phase of a first clock signal based on a phase control signal and outputs a second clock signal; a first flip-flop to which one of the first clock signal and the second clock signal is inputted as a first operation clock signal, and which outputs evaluation data; a circuit under test which performs a predetermined process based on the evaluation data and outputs a result of the process as output data; and a second flip-flop to which the other of the first clock signal and the second clock signal is inputted as a second operation clock signal and the output data is inputted, and which outputs the output data inputted from the circuit under test.


Find Patent Forward Citations

Tanaka, Yoshiyuki. (2006). Semiconductor integrated circuit including operation test circuit and operation test method thereof (U.S. Patent No. 7134060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7134060

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