The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Dec. 23, 2002
Nisha D. Talagala, Fremont, CA (US);
Brian Wong, Gordonsville, VA (US);
Nisha D. Talagala, Fremont, CA (US);
Brian Wong, Gordonsville, VA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Diagnosis of corruption in interrelated data entities uses a graph of nodes and edges. Datum nodes represent the data entities, relationship nodes represent the relationships among the data entities. The datum nodes are connected through their relationship nodes by the edges. When corruption is detected, the relationships are analyzed and each edge connecting a datum node to a relationship node is removed from the graph when the corresponding relationship is invalid. The datum nodes that remain connected to their relationship nodes form a subgraph and the corresponding data entities are considered correct. In one aspect, if more than one subgraph is formed, the datum nodes in the largest are used. In another aspect, the data entities and relationships are analyzed to create the graph when the data entities are assumed correct. The data entities may be data and metadata of various types that can be associated with the data.