The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2006

Filed:

Apr. 17, 2003
Applicants:

Keith H. Bierman, San Jose, CA (US);

David R. Emberson, Santa Cruz, CA (US);

Liang T. Chen, Saratoga, CA (US);

Inventors:

Keith H. Bierman, San Jose, CA (US);

David R. Emberson, Santa Cruz, CA (US);

Liang T. Chen, Saratoga, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of providing accelerated post-silicon testing for a silicon hardware includes computing a simulation cumulative record of state using a plurality of test instructions and a cycle breakpoint, performing a simulation of an instrumented logic design using the plurality of test instructions and the cycle breakpoint, manufacturing the silicon hardware using the instrumented logic design, computing a silicon cumulative record of state by executing the plurality of instructions using the silicon hardware; and comparing the simulation cumulative record of state to the silicon cumulative record of state.


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