The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2006

Filed:

Mar. 23, 2001
Applicants:

Rick V. Murakami, North Ogden, UT (US);

Clark Hinton, Glendale, AZ (US);

Matthew W. Pettit, Mountain Green, UT (US);

Inventors:

Rick V. Murakami, North Ogden, UT (US);

Clark Hinton, Glendale, AZ (US);

Matthew W. Pettit, Mountain Green, UT (US);

Assignee:

Ensign Holdings, LLC, Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed toward a method for calibrating a biometric authentication device over time. The method of the present invention involves obtaining an authenticating biometric value from a biometric measurement. The biometric value is then weighted and integrated into the authentication data set or template.


Find Patent Forward Citations

Murakami, Rick. (2006). Method and apparatus for calibration over time of histological and physiological biometric markers for authentication (U.S. Patent No. 7133792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7133792

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…