The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2006

Filed:

Mar. 31, 2005
Applicant:

Ming-shi Liou, Taipei Hsien, TW;

Inventor:

Ming-Shi Liou, Taipei Hsien, TW;

Assignee:

VIA Technologies, Inc., Taipei Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and system of calibrating the control delay time, providing effective calibration for the control delay time provided by a control chip to reach the optimal effect for effective reading. The control chip uses the connected buffer chip to produce a training sequence when the buffer chip enters a training mode. After the control chip receives the training sequence, the control chip will produce the training data to compare with the predefined pattern inside it and adjust the control delay time. Finally, the control chip will produce an optimal adjusting control delay time to allow the data strobe signal to control the effective retrieved range of the data.


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