The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Jul. 27, 2001
Robert J. Buchler, Calabasas, CA (US);
Peter Kyriacou, Sun Valley, CA (US);
Daniel A. Tazartes, West Hills, CA (US);
Robert J. Buchler, Calabasas, CA (US);
Peter Kyriacou, Sun Valley, CA (US);
Daniel A. Tazartes, West Hills, CA (US);
Litton Systems, Inc., Woodland Hills, CA (US);
Abstract
A method for attitude alignment of a slave inertial measurement system connected to a rotationally mobile platform supported by a vehicle that is stationary relative to a reference navigation frame comprises the steps of mounting a master reference inertial measurement system on the rotationally mobile platform and determining a master reference system attitude using measurements of acceleration and angular rates of the master reference inertial measurement system relative to the reference navigation frame. A slave system attitude is determined using measurements of acceleration and angular rates of the slave inertial measurement system relative to a slave system navigation reference frame and comparing the slave system attitude to the master reference system attitude to determine an attitude difference. The attitude difference is processed to obtain a correction to the slave system attitude.