The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Feb. 28, 2002
Edward Ratner, Sunnyvale, CA (US);
Adityo Prakash, Redwood Shores, CA (US);
Hitoshi Watanabe, San Jose, CA (US);
Sachin Ahuja, Mountain View, CA (US);
Edward Ratner, Sunnyvale, CA (US);
Adityo Prakash, Redwood Shores, CA (US);
Hitoshi Watanabe, San Jose, CA (US);
Sachin Ahuja, Mountain View, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
One embodiment relates to an apparatus for image processing. The apparatus includes a candidate edge chain identifier for identifying candidate edge chains in an image being processed, means for calculating a dynamic chain-based threshold function that is dependent on at least one characteristic of the image being processed, and a threshold applicator for applying the dynamic chain-based threshold function to the candidate edge chains. The characteristic of the image being processed may be global in that it is determined from the overall image being processed. A system may include an encoder or a decoder, both of which include the above apparatus. Another embodiment relates to a method for image processing. The method determines a dynamic chain-based threshold function that is dependent on at least one characteristic of the image being processed and applies the dynamic threshold to a candidate edge chain.