The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Apr. 11, 2005
Xiaodong Che, Saratoga, CA (US);
Wen-chien David Hsiao, San Jose, CA (US);
Yansheng Luo, Fremont, CA (US);
Xiaoyu Sui, Fremont, CA (US);
Samuel Wei-san Yuan, Saratoga, CA (US);
Xiaodong Che, Saratoga, CA (US);
Wen-Chien David Hsiao, San Jose, CA (US);
Yansheng Luo, Fremont, CA (US);
Xiaoyu Sui, Fremont, CA (US);
Samuel Wei-san Yuan, Saratoga, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A method and apparatus for optimizing data record quality on a disk for a pair of read and write heads, in which the write head is bigger, by adaptively varying linear and track density of overlapping recorded tracks to achieve a target storage capacity. In the method, target storage capacity and radial writing direction are selected. Read and write widths of heads are determined. A linear density and offset distance pairing for optimizing record quality at target storage capacity is determined, wherein offset distance is less than write width but greater than read width. The write head writes a track at the linear density, is offset in the radial direction by the offset distance, and the offset distance is stored. The write head writes a new track at the linear density. Offsetting, storing offset, and writing a new track are repeated until desired data is written into a cluster.