The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Feb. 20, 2004
Applicant:
Christophe J. Dorrer, Matawan, NJ (US);
Inventor:
Christophe J. Dorrer, Matawan, NJ (US);
Assignee:
Lucent Technologies, Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for the direct characterization of the phase of an optical signal includes measuring the interference between the optical signal and a sequence of optical pulses and processing the measured interference. The method and apparatus split and combine the optical signal and the sequence of optical pulses in order to measure the real and imaginary part of the interference signal for a least two pulses from the sequence of optical pulses. Processing steps are disclosed to obtain phase information on the optical signal from the measured interference.