The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Sep. 17, 2004
Carlos J. Bustamante, Berkeley, CA (US);
Steven B. Smith, Berkeley, CA (US);
Carlos J. Bustamante, Berkeley, CA (US);
Steven B. Smith, Berkeley, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
An optical trap and method for measuring both transverse and longitudinal forces on a trapped particle. Laser light sources generate first and second light beams that are focused to the trap region in a counter-propagating manner for trapping the particle. Detectors measure changes in power deflections of the light beams leaving the trap region, and changes in power concentrations of the light beams leaving the trap region. A processor calculates the transverse forces on the particle based upon the measured changes in the power deflections of the light beams, and calculates the longitudinal forces on the particle based upon the measured changes in the power concentrations of the light beams. A single beam optical trap and method are also disclosed, where the second optical beam is generated by a reflection of the first optical beam off of the trapped particle.