The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Jul. 29, 2004
Yuan-hsiang Lee, Winchester, MA (US);
William Joseph Mcgann, Raynham, MA (US);
Kenneth Arthur Ribeiro, North Reading, MA (US);
Tao Deng, Clifton Park, NY (US);
Yuan-Hsiang Lee, Winchester, MA (US);
William Joseph McGann, Raynham, MA (US);
Kenneth Arthur Ribeiro, North Reading, MA (US);
Tao Deng, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A cargo inspection apparatus for the inspection of an analyte carried by a medium is disclosed. The apparatus includes a housing having an inlet allowing for entry of the medium and an outlet allowing for exit of the medium, and an adsorber disposed within the housing in fluid communication with the medium flow from the inlet to the outlet, the adsorber includes a substrate having disposed thereon a nanoparticle film. The nanoparticle film has nanoparticles having an average particle size of equal to or less than about 500 nanometers.