The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2006

Filed:

Sep. 22, 2003
Applicants:

Jong Dam Kim, Kyounggi-do, KR;

Hyun Kyu Lee, Seoul, KR;

Yong Jin Cho, Seoul, KR;

See Hwa Jeong, Kyounggi-do, KR;

Inventors:

Jong Dam Kim, Kyounggi-do, KR;

Hyun Kyu Lee, Seoul, KR;

Yong Jin Cho, Seoul, KR;

See Hwa Jeong, Kyounggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.


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