The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Aug. 19, 2005
Michael Anthony Lamson, Anna, TX (US);
Jay Michael Lawyer, Keller, TX (US);
Roger Joseph Stierman, Dallas, TX (US);
Michael Anthony Lamson, Anna, TX (US);
Jay Michael Lawyer, Keller, TX (US);
Roger Joseph Stierman, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
In a method and system for testing a test sample (), a simulation program () is used to augment test results provided by a legacy test system (). The legacy test system () includes a measuring device () providing a test input () to the test sample () and receiving a test output () from the test sample () in response to the test input (). The simulation program () simulates the test sample () by predicting a simulated output () of the test sample () in response to receiving a simulated input (). A plurality of simulated failures is simulated in the simulation program (), with each simulated failure generating a corresponding simulated output. The simulation program () includes a model () for the measuring device (), the model () providing the simulated input (). A comparator () compares the test output () with the simulated output () to determine a match. The simulated failure providing the match is used to predict a predicted failure location within the test sample ().