The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2006

Filed:

Mar. 29, 2004
Applicants:

Steffen Peters, Linnich, DE;

Reinhard Knöchel, Elmshorn, DE;

Wolfgang Taute, Laboe, DE;

Claas Döscher, Hamburg, DE;

Inventors:

Steffen Peters, Linnich, DE;

Reinhard Knöchel, Elmshorn, DE;

Wolfgang Taute, Laboe, DE;

Claas Döscher, Hamburg, DE;

Assignee:

Trützschler GmbH & Co. KG, Mönchengladbach, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a measuring arrangement for measuring the density of a product by means of microwaves. The measuring arrangement comprises a first microwave resonator, from which, in operation, microwaves enter a product area, and a device for compensating for environmental influences and disturbance variables affecting the measuring signal of the first microwave resonator. According to the invention, the compensation device comprises a second microwave resonator, which is shielded towards the product area with respect to microwave radiation.


Find Patent Forward Citations

Loading…