The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
May. 07, 2004
Scott William Petrick, Sussex, WI (US);
Alan Dean Blomeyer, Milwaukee, WI (US);
Jingyi Liang, Waukesha, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
Scott William Petrick, Sussex, WI (US);
Alan Dean Blomeyer, Milwaukee, WI (US);
Jingyi Liang, Waukesha, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Certain embodiments provide a method and system for improved x-ray image data acquisition using a digital x-ray detector. The method and system include defining groups of scan lines in a detector, associating data lines in the detector with the groups of scan lines, and reading image data from the groups of scan lines using the associated data lines. The scan lines are connected with a plurality of pixels. A region of interest may be defined in the detector. The pixels obtain image data regarding the region of interest. The image data may be read from at least one scan line in each of the groups of scan lines using the associated data lines. Alternatively, the image data may be read from alternating groups of the scan lines using the associated data lines. Image data may also be binned from adjacent pixels read using a plurality of data lines.