The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Aug. 20, 2002
Jorma Keskinen, Tampere, FI;
Mikko Moisio, Tampere, FI;
Marko Marjamäki, Tampere, FI;
Annele Virtanen, Varalankatu, FI;
Jyrki Ristimäki, Tampere, FI;
Jorma Keskinen, Tampere, FI;
Mikko Moisio, Tampere, FI;
Marko Marjamäki, Tampere, FI;
Annele Virtanen, Varalankatu, FI;
Jyrki Ristimäki, Tampere, FI;
Dekati, Oy, Tampere, FI;
Abstract
A method and a device for measuring density properies of a particle distribution, in which method a first parameter relating to the particle distribution is measured at a first measuring point (), at least part of the flow that passed through the first measuring point is guided to the second measuring point (), a second parameter relating to the particle distribution is measured at a second measuring point (), and said first and second parameters relating to the particle distribution are used to determine at least one density property of the particle distribution of the original flow ().