The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Mar. 13, 2003
Gavin G. Gibson, Westminster, CO (US);
Todd H. Mckenney, Broomfield, CO (US);
Christian Cadieux, Louisville, CO (US);
Paula C. Kiser, Golden, CO (US);
Gavin G. Gibson, Westminster, CO (US);
Todd H. McKenney, Broomfield, CO (US);
Christian Cadieux, Louisville, CO (US);
Paula C. Kiser, Golden, CO (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Provided are a method, system and article of manufacture for fault determination. A duration of time is determined for receiving an event. A plurality of events are received in a time period that is at least twice the determined duration. A plurality of factors are determined corresponding to the plurality of events. At least one factor is determined from the plurality of factors, wherein the at least one factor is a cause of at least one of the plurality of events.