The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Apr. 10, 2002
Randy S. Bay, Woodbury, MN (US);
Elisa J. Collins, Oakdale, MN (US);
James N. Dobbs, Woodbury, MN (US);
Randy S. Bay, Woodbury, MN (US);
Elisa J. Collins, Oakdale, MN (US);
James N. Dobbs, Woodbury, MN (US);
3M Innovative Properties Company, Saint Paul, MN (US);
Abstract
In general, techniques are described for the creation and execution of accurate models for the manufacture of complex, multi-layered materials. The techniques may be used to calculate variations of a process parameter within the material during the manufacturing process. A method comprises receiving segment data that partitions a manufacturing process into a set of segments having at least one layer of a material. For example, the segment data may partition the manufacturing processes along a path traversed by the material within the manufacturing process. The method further comprises receiving curvature data for the layers, and calculating values for a process parameter through the layers of the segments as a function of the curvature data. The method may comprise invoking a one-dimensional model, such as a one-dimensional finite difference model, to calculate the values for the defined segments and layers.