The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Mar. 25, 2002
David L. Ii, Owego, NY (US);
Elliott D. Reitz, Ii, Endicott, NY (US);
Dennis A. Tillotson, Cortland, NY (US);
David L. Ii, Owego, NY (US);
Elliott D. Reitz, II, Endicott, NY (US);
Dennis A. Tillotson, Cortland, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
The present invention recites a method and computer program product for generating a set of training samples from a single ideal pattern for each output class of a pattern recognition classifier. A system equivalent pattern is generated for each of a plurality of classes from a corresponding ideal pattern. A noise model, simulating at least one type of noise expected in a real-world classifier input pattern, is then applied to each system equivalent pattern a set number times to produce, for each output class, a number of training samples. Each training sample simulates defects expected in real-world classifier input patterns.