The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2006
Filed:
Dec. 31, 2003
Kendall S. Wills, Sugar Land, TX (US);
Kartik Ramanujachar, Sugar Land, TX (US);
Kendall S. Wills, Sugar Land, TX (US);
Kartik Ramanujachar, Sugar Land, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
In one embodiment, a method for wavelet analysis of one or more signals to determine one or more characteristics of one or more anomalies in a wire includes receiving a first signal from a detector that has scanned a magnetic field from a wire including an anomaly. The first signal corresponds to a second signal used to generate the magnetic field. The method includes calculating a wavelet analysis result from a wavelet analysis of the first signal. The wavelet analysis result corresponds to the second signal. The method includes accessing a library of one or more reference wavelet analysis results that each correspond to one or more known anomalies having one or more known characteristics and comparing the wavelet analysis result with one or more reference wavelet analysis results. If the wavelet analysis result corresponds to one or more particular reference wavelet analysis results, it is indicated that the anomaly in the wire has one or more particular known characteristics of one or more particular known anomalies corresponding to the one or more particular reference wavelet analysis results. If the wavelet analysis result of the TDR signal does not correspond to one or more reference wavelet analysis results, it is indicated that the anomaly in the wire lacks one or more known characteristics of one or more known anomalies corresponding to one or more reference wavelet analysis results in the library.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile