The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2006

Filed:

Mar. 13, 2006
Applicant:

Jinxi Shen, San Ramon, CA (US);

Inventor:

Jinxi Shen, San Ramon, CA (US);

Assignee:

JDS Uniphase Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/28 (2006.01); H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical performance monitor for accurate monitoring of the OSNR of a WDM optical signal is provided wherein a demultiplexing arrayed waveguide grating (AWG) having a plurality of Vernier input ports is disposed between an optical switch and a photodiode array coupled to the output ports of the AWG. In operation, the optical switch sequentially provides the input optical signal into each of the Vernier ports, and signals detected by photodiodes are stored in a memory unit. The apparatus is capable of monitoring the OSNR of the WDM signal with a frequency step which is M times smaller than a frequency spacing between the AWG transmission bands, while enabling the OSNR monitoring in an enhanced dynamic range by providing accurate noise sampling.


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