The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2006

Filed:

May. 13, 2005
Applicants:

Makio Tokunaga, Mishima, JP;

Yoshihiro Ue, Hidaka, JP;

Inventors:

Makio Tokunaga, Mishima, JP;

Yoshihiro Ue, Hidaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 7/04 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The microscope apparatus has an objective lens, a sample base on which an observation sample is placed, a sensor target mounted on the tip portion of the objective lens, and a non-contact sensor mounted on the sample base. The non-contact sensor detects the distance to the sensor target. The microscope further has a motor that moves the objective lens along the optical axis and the controller that controls the motor to keep the relative distance between the tip portion of the objective lensand the sample base constant while the control switch is ON.


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