The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7130060 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 31, 2006

Filed:

Mar. 03, 2005
Applicants:

Darryl J. Bornhop, Nashville, TN (US);

Peter Eskil Andersen, Roskilde, DK;

Henrik Schiott Sorensen, Roskilde, DK;

Henrik Pranov, Lyngby, DK;

Inventors:

Darryl J. Bornhop, Nashville, TN (US);

Peter Eskil Andersen, Roskilde, DK;

Henrik Schiott Sorensen, Roskilde, DK;

Henrik Pranov, Lyngby, DK;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus for absolute refractive index measurements are disclosed, wherein a beam of spatially coherent laser light is directed perpendicularly on to a side of a capillary tube () and back reflected light is detected () over a range of angles () with respect to the incident light beam. The refractive index of a liquid contained in the capillary is determined from the angle at which a marked change in the intensity of the interference fringes of the interference pattern formed by said back reflected light is observed or from the amplitude of a low frequency component of the angular variation of the intensity of interference fringes.


Find Patent Forward Citations

Bornhop, Darryl. (2006). Refractive index determination by micro interferometric reflection detection (U.S. Patent No. 7130060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7130060

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